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  1. History

    An account of the early history of scanning electron microscopy has been presented by McMullan. Although See more

    Scanning electron microscope - Wikipedia

    • A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a r… See more

    Zoom in with the SEM!
    Zoom in with the SEM!
    Have you ever wondered what things look like at the microscopic level? How can we see the details of a mineral, a cell, or a virus? One of the instruments that can help us do that is the scanning electron microscope, or SEM for short.
    Principles and capacities

    The signals used by a SEM to produce an image result from interactions of the electron beam with atoms at various depths within the sample. Various types of signals are produced including secondary electrons (SE), reflec… See more

    Sample preparation

    SEM samples have to be small enough to fit on the specimen stage, and may need special preparation to increase their electrical conductivity and to stabilize them, so that they can withstand the high vacuum conditions … See more

    Scanning process and image formation

    In a typical SEM, an electron beam is thermionically emitted from an electron gun fitted with a tungsten filament cathode. Tungsten is normally used in thermionic electron guns because it has the highest melting poi… See more

    Detection of secondary electrons

    The most common imaging mode collects low-energy (<50 eV) secondary electrons that are ejected from conduction or valence bands of the specimen atoms by inelastic scattering interactions with beam electrons. Due to thei… See more

    Detection of backscattered electrons

    Backscattered electrons (BSE) consist of high-energy electrons originating in the electron beam, that are reflected or back-scattered out of the specimen interaction volume by elastic scattering interactions with speci… See more

    Beam-injection analysis of semiconductors

    The nature of the SEM's probe, energetic electrons, makes it uniquely suited to examining the optical and electronic properties of semiconductor materials. The high-energy electrons from the SEM beam will inject … See more

     
  1. Scanning electron microscopy, or SEM, is a powerful technique used in chemistry and material analysis that uses a scanned electron beam to analyze the surface structure and chemical composition of a sample. Modern light microscopes are limited by the interaction of visible light waves with an object, called diffraction.
    www.jove.com/v/5656/scanning-electron-microsco…
    Scanning electron microscopy is a highly versatile technique used to obtain high-resolution images and detailed surface information of samples. It is a type of electron microscopy that uses a focused beam of electrons to scan the surface of a specimen and generate images at a much greater resolution compared to optical microscopy.
    www.nanoscience.com/techniques/scanning-electr…
    In SEM, the electron beam scans the sample in a raster-pattern. Instead of passing through the specimen, electrons get reflected on the surface or even ionize atoms within the sample by liberating electrons. These so-called secondary electrons, as well as the backscattered electrons, can serve as signal to build up the final image.
    assets.thermofisher.com/TFS-Assets/MSD/Referen…
  2. Scanning Electron Microscopy (SEM) - SERC

  3. Scanning Electron Microscopy (SEM): Principle

    Apr 21, 2023 · Scanning electron microscopy (SEM) is one of the most popular and widely used techniques for the characterization of nanomaterials and nanostructures. With a magnification range of 10 to over 300,000, SEM can …

  4. Scanning Electron Microscopy: A Comprehensive Guide - Wevolver

  5. Scanning Electron Microscopy and X-Ray Microanalysis

    This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for …

  6. Scanning Electron Microscope (SEM): Principle, Parts, …

    May 5, 2024 · Scanning Electron Microscope (SEM) is a type of electron microscope that scans surfaces of microorganisms that uses a beam of electrons moving at low energy to focus and scan specimens.

  7. Introduction to Scanning Electron Microscopy (SEM)

    Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the structural intricacies of metals and rocks, …

  8. Scanning Electron Microscopy - PMC - PubMed Central (PMC)