ZEISS announces the new ZEISS Crossbeam 550 Samplefab, a focused ion beam scanning electron microscope (FIB-SEM) optimized for fully automated preparation of transmission electron microscopy (TEM) ...
The Intel i486 might be over 30 years old, but it's still an incredible piece of technology. Especially when viewed up close with a scanning electron microscope.
The Hayabusa2 mission was one attempt to address this, and with some success — parts of its sample ... after a subsequent week using a scanning electron microscope (SEM). Surprisingly, their ...
Scanning electron microscopy is a general type of electron microscopy that generates a topological image of a sample using a beam of electrons to achieve much higher spatial resolution than light ...