Given the complexity and cost of these devices ... Yet, ongoing improvements in SEM technology, such as advancements in low-vacuum and environmental SEMs, are helping overcome these barriers, ...

By studying how light reflects from the surface of metals, engineers can now tell if manufactured parts meet quality control ...

The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...

as well as to researchers from industry sectors at an affordable cost. At the CeNSR, you can obtain the highest possible quality data using the highly developed, high-resolution Atomic Force ...

The Cambridge solution is a technique based on visible light, directional reflectance microscopy (DRM), intended to offer the same microstructural information in ambient environment, at a fraction of ...

A technical paper titled “Imaging hot photocarrier transfer across a semiconductor heterojunction with ultrafast electron microscopy” was published by researchers at UC Santa Barbara and UCLA. “In ...