资讯

IEEE21 小时
Nanometer-length characterization with CMOS-MEMS scanning microwave microscopes | IEEE ...
In this paper, we show characterization of nanometer-length feature samples with low cost CMOS-MEMS based integrated Scanning Microwave Microscope (SMM) and Atomic Force Microscope (AFM). The ...
Scientific Research Publishing4 天
Core-Shell VN@PCNs Nanoreactors as Cathode Materials for High-Performance Aqueous Zinc Ion ...
Wang, Y. , Yong, T. , Wang, Y. , Yang, Y. and Li, X. (2025) Core-Shell VN@PCNs Nanoreactors as Cathode Materials for ...