To explore the viral structures present within these biomolecular condensates, we used a combination of double immunogold labeling, electron microscopy and tomography, and unveiled a diverse array of ...

Electron microscopy uses a beam of electrons to illuminate a sample and achieve much higher spatial resolution than light microscopy. Transmission electron microscopy generates an image of the ...

Throughout the manufacturing process of bijels, De Ruiter experimented with various parameters and then examined the results using two advanced microscopy techniques. With a confocal laser scanning ...

Institute of Organic Chemistry and Biochemistry of the Academy of Sciences, Flemingovo Nám. 2, Prague 16610, Czech Republic University of Chemistry and Technology Prague, Technická 5, Prague 16628, ...

Department of Chemistry, Northwestern University, 2145 Sheridan Road, Evanston, Illinois 60208, United States International Institute for Nanotechnology, Northwestern University, 2145 Sheridan Road, ...

ZEISS announces the new ZEISS Crossbeam 550 Samplefab, a focused ion beam scanning electron microscope (FIB-SEM) optimized for fully automated preparation of transmission electron microscopy (TEM) ...

Scanning electron microscopy is a general type of electron microscopy that generates a topological image of a sample using a beam of electrons to achieve much higher spatial resolution than light ...

Traditionally, scanning electron microscopy (SEM) has been an effective tool to examine nanoscale structures. SEM works by scanning a sample with a focused electron beam and capturing the SEs ...

The Axio Imager Z1m from Zeiss is a fully motorized upright microscope. The system is intended for an easy and fast approach to fluorescence microscopy of live and fixed samples. It is equipped with a ...

‘The technology that we developed in my group is this continuous rotation of the stage. Electron microscopes are not designed for movement so we built controllers to coordinate the movement of the ...

The authors provide compelling support for some presence of Hebbian rewiring, using combined confocal imaging and serial electron microscopy ... Wafers were mapped on a Zeiss Merlin scanning electron ...