Most contact or stylus-based surface metrology equipment provides a two-dimensional (2D) or line profile. b. Non-contact instruments measure surface texture by optically scanning the surface with a ...

These semiconductor metrology instruments can be used to monitor features such as line, space, and pitch; roundness or concentricity; or depth or sidewall measurements. An ion mill is used to prepare ...

and laser systems used in industries ranging from defense and aerospace to semiconductor exposure and inspection systems and medical imaging systems. Precision metrology is required for the production ...

Features an in-depth assessment of market shares, growth strategies, and offerings of leading players, including Hexagon AB, ...

By CMM Type, bridge CMM segment to account for the largest market share in 2029.

The efficiency of the DynaFiz’s optical system, along with its high power, HeNe laser source and long lifespan, allows operation at high camera shutter speeds. This capability provides consistent ...