The large-scale Laser Ranging and Metrology Test Facility (LRMT) at the DLR-Institute of Quantum Technologies provides the necessary infrastructure for the verification of high-resolution laser ...

We work with chip manufacturers and validate and demonstrate metrology equipment concepts for other high-tech industries in, amongst others, the space, nuclear, and quantum technology domains. Chip ...

But current optical metrology requires bulky and expensive equipment to achieve delicate laser-wave control, creating a bottleneck for deploying streamlined, cost-effective systems.

More information: Shixin Xue et al, Pockels laser directly driving ultrafast optical metrology, Light: Science & Applications (2025). DOI: 10.1038/s41377-025-01872-4 Provided by University of ...

The HeNe laser source manufactured by ZYGO, coupled with ZYGO’s patented acquisition algorithms and full-featured Mx TM metrology software, enables high-precision metrology with simple analysis ...

But current optical metrology requires bulky and expensive equipment to achieve delicate laser-wave control, creating a bottleneck for deploying streamlined, cost-effective systems.

But current optical metrology requires bulky and expensive equipment to achieve delicate laser-wave control, creating a bottleneck for deploying streamlined, cost-effective systems.

The graph below shows the total number of publications each year in Laser Power Measurement and Force Metrology. References [1] Quantum-limited optical lever measurement of a torsion oscillator.

The tool enables NIST to measure the thermal conductivity of wide bandgap power electronics materials, packaging materials, and integrated chip components, directly supporting the CHIPS thermal ...

Standardizing New Materials, Processes, and Equipment for Microelectronics Metrology to Enhance Security and Provenance of Microelectronic-based Components and Products ...

Peak Metrology, automated metrology equipment designer and manufacturer, and Digital Surf, editor of analysis software solutions for profilometry, microscopy and spectroscopy, have announced the ...